Data Converter Development Platforms
Data converter development platforms provide the essential hardware and software infrastructure for evaluating, prototyping, and optimizing analog-to-digital converters (ADCs) and digital-to-analog converters (DACs). These platforms bridge the analog and digital domains, enabling engineers to characterize converter performance, develop signal conditioning circuits, and validate complete signal chain designs before committing to production hardware.
The complexity of modern data conversion systems demands specialized development tools. High-resolution converters require exceptionally clean power supplies, low-noise references, and careful layout techniques that are difficult to achieve without proven reference designs. High-speed converters present additional challenges including transmission line effects, clock distribution, and thermal management. Development platforms address these challenges by providing characterized, validated circuits that demonstrate achievable performance levels.
This guide explores the major categories of data converter development hardware, covering ADC evaluation boards across SAR, delta-sigma, and pipeline architectures, DAC development platforms for precision and high-speed applications, integrated analog front-end systems, precision reference evaluation, signal chain development tools, and specialized testing systems for dynamic and linearity measurements. Understanding these platforms enables informed selection and effective application of data converter technology.
ADC Evaluation Boards
Analog-to-digital converter evaluation boards provide controlled environments for characterizing ADC performance and developing application circuits. These platforms range from simple breakout boards that expose converter pins to sophisticated systems with integrated signal conditioning, clock generation, and digital interfaces.
SAR ADC Development Platforms
Successive approximation register (SAR) ADCs dominate applications requiring moderate speed with high accuracy and low power consumption. SAR evaluation boards demonstrate the critical requirements for these converters, including reference voltage quality, input signal conditioning, and digital interface implementation.
Modern SAR ADCs achieve resolutions from 8 to 20 bits with sample rates from kilosamples to several megasamples per second. Evaluation platforms for these devices typically include low-noise input buffers, anti-aliasing filter circuits, and precision voltage references. Many provide selectable input configurations supporting single-ended, differential, and pseudo-differential signal connections.
Texas Instruments, Analog Devices, and Microchip offer extensive portfolios of SAR ADC evaluation modules. These platforms typically connect to vendor-specific software tools that configure converter parameters, capture sample data, and perform FFT analysis for dynamic performance characterization. Reference designs and layout files enable rapid transition from evaluation to custom hardware development.
Key considerations for SAR ADC development include input impedance effects, acquisition time requirements, and reference loading. Many SAR converters have input impedance that varies with sampling phase, requiring careful input buffer design. Evaluation boards demonstrate appropriate buffer topologies and provide test points for verifying circuit behavior.
Delta-Sigma ADC Platforms
Delta-sigma (also called sigma-delta) ADCs achieve the highest resolution levels through oversampling and noise shaping techniques. These converters excel in precision measurement applications including weigh scales, temperature measurement, and industrial process control. Development platforms for delta-sigma ADCs emphasize low-noise analog design and proper handling of the digital decimation filter characteristics.
Delta-sigma ADC evaluation boards from major vendors typically achieve 16 to 32 bits of resolution at sample rates from fractions of a hertz to hundreds of kilohertz. The oversampling architecture relaxes anti-aliasing filter requirements compared to Nyquist-rate converters, but evaluation platforms still demonstrate proper input filtering to reject out-of-band interference.
Analog Devices' EVAL-AD7124 and similar platforms exemplify delta-sigma development tools, providing low-noise power supplies, multiple input configurations, and integration with SigmaStudio software for digital filter configuration. Texas Instruments' ADS1256 and ADS1263 evaluation modules address similar precision measurement applications with comprehensive software support.
Unique considerations for delta-sigma development include understanding the relationship between output data rate and effective resolution, managing the latency introduced by digital filtering, and optimizing the trade-off between noise rejection and settling time. Evaluation platforms allow systematic exploration of these parameters to identify optimal configurations for specific applications.
Pipeline ADC Development
Pipeline ADCs achieve high sample rates of tens to hundreds of megasamples per second while maintaining reasonable resolution, typically 10 to 16 bits. These converters dominate communications, radar, and high-speed data acquisition applications. Development platforms for pipeline ADCs address unique challenges including wideband input signal handling, low-jitter clock distribution, and high-speed digital data capture.
Pipeline ADC evaluation boards feature carefully designed analog input networks with controlled impedance matching and wideband frequency response. Clock inputs typically specify maximum jitter requirements and provide reference oscillator options or accept external low-phase-noise sources. Digital outputs may use LVDS, CML, or serialized interfaces requiring appropriate termination and capture hardware.
Analog Devices' high-speed ADC evaluation platforms integrate with the ACE (Analysis, Control, Evaluation) software environment and often include FPGA-based data capture systems. Texas Instruments provides similar platforms with integration to the High Speed Data Converter Pro software. These systems enable real-time spectrum analysis, time-domain capture, and automated test sequences for comprehensive device characterization.
High-speed ADC development requires attention to power supply sequencing, thermal management, and proper handling of the converter's internal reference. Evaluation platforms document these requirements and provide reference implementations that achieve datasheet performance levels, serving as proven starting points for custom designs.
Specialty ADC Architectures
Beyond the three dominant architectures, specialized ADC types address specific application requirements. Flash ADCs provide the highest conversion speeds for oscilloscope and radar applications. Integrating ADCs achieve extreme resolution for scientific instrumentation. Folding and interpolating architectures balance speed and power consumption for specific ranges.
Evaluation platforms for specialty ADCs often come from the semiconductor manufacturers as application-specific reference designs. While less common than SAR or delta-sigma evaluation boards, these platforms provide essential support for designers working with demanding high-speed or high-resolution applications.
DAC Development Platforms
Digital-to-analog converter development platforms enable evaluation of DAC performance and development of output signal conditioning circuits. Like ADC platforms, these range from simple evaluation boards to comprehensive systems with integrated waveform generation and output analysis capabilities.
Precision DAC Evaluation
Precision DACs serve applications requiring accurate, stable analog outputs including industrial control, calibration systems, and test equipment. Resolutions of 12 to 20 bits with excellent DC specifications characterize this category. Evaluation platforms emphasize output accuracy, temperature stability, and long-term drift performance.
Precision DAC development boards typically include precision voltage references, output buffers, and filtering appropriate for DC to low-frequency applications. Many provide multiple output configurations to evaluate bipolar versus unipolar operation, voltage versus current output, and different loading conditions.
Analog Devices' LTC2688 evaluation kit exemplifies precision DAC development platforms, providing 16-channel, 16-bit outputs with comprehensive software control. Texas Instruments offers DAC8xxx evaluation modules spanning various resolutions and channel counts. These platforms demonstrate the reference, power supply, and layout techniques needed to achieve datasheet specifications.
Key precision DAC development considerations include output settling time versus noise bandwidth trade-offs, reference temperature coefficient matching, and load regulation. Evaluation platforms provide characterized performance under various load conditions and enable comparison of output topologies.
High-Speed DAC Platforms
High-speed DACs generate the waveforms needed for communications transmitters, radar systems, and arbitrary waveform generation. Sample rates from hundreds of megasamples to several gigasamples per second combine with resolutions of 8 to 16 bits. Development platforms for these devices address wideband output signal handling, reconstruction filter design, and high-speed digital interface requirements.
High-speed DAC evaluation boards feature controlled-impedance output networks, often with integrated transformer coupling for communications applications. Clock inputs specify stringent jitter requirements similar to high-speed ADCs. Digital interfaces commonly use JESD204B or similar serialized standards requiring FPGA-based pattern generation for comprehensive testing.
Analog Devices and Texas Instruments provide high-speed DAC evaluation platforms with integrated FPGA pattern generators and RF output circuitry. These systems support complex modulated waveform generation for communications applications alongside simple tone and multi-tone outputs for spectral purity measurements.
Direct digital synthesis (DDS) and numerically controlled oscillator (NCO) capabilities often integrate with high-speed DACs, requiring additional development support for frequency tuning and modulation. Evaluation platforms demonstrate these capabilities and provide software tools for waveform configuration.
Audio DAC Development
Audio DACs present unique development requirements emphasizing perceptual quality alongside measurable specifications. Delta-sigma architectures dominate this space, achieving 24-bit resolution with sample rates supporting the full audio bandwidth. Development platforms address not only electrical specifications but also the analog output stages that ultimately determine sound quality.
Audio DAC evaluation boards from ESS Technology, Cirrus Logic, and AKM (Asahi Kasei Microdevices) provide complete audio output systems including current-to-voltage conversion, filtering, and headphone amplification. Many support multiple digital input formats including I2S, S/PDIF, and USB Audio, enabling evaluation in realistic system configurations.
Audio-specific considerations include output stage topology effects on load driving capability, filter design impacts on transient response, and power supply rejection at audio frequencies. Evaluation platforms allow comparison of these design choices under controlled conditions.
Current-Output and Specialized DACs
Current-output DACs serve applications where the load presents a virtual ground, including multiplying DAC configurations and current-steering applications. Development platforms for these devices demonstrate proper output termination and voltage compliance considerations.
Specialized DACs for specific applications such as display driver ICs, motor control, and laser diode drivers have corresponding evaluation platforms that address application-specific requirements. While less general-purpose, these platforms provide essential support for designers working in those domains.
Integrated Analog Front-End Boards
Analog front-end (AFE) development platforms combine multiple functions including signal conditioning, multiplexing, and data conversion into integrated evaluation systems. These platforms address complete signal paths from sensor input to digital data output, demonstrating proper integration of amplification, filtering, and conversion stages.
Precision Measurement AFE Systems
Precision measurement AFE platforms target applications including industrial sensors, medical instrumentation, and laboratory equipment. These systems typically combine programmable gain amplifiers (PGAs), anti-aliasing filters, and delta-sigma ADCs optimized for high-resolution, low-bandwidth measurements.
Texas Instruments' ADS1298 evaluation module exemplifies medical AFE development, providing eight channels of biopotential measurement circuitry suitable for ECG and EEG applications. Analog Devices' AD7124 evaluation platforms address industrial measurement with integrated excitation sources, programmable gain, and precision analog-to-digital conversion.
AFE development considerations include crosstalk between channels, common-mode rejection across the signal chain, and proper handling of sensor excitation. Evaluation platforms demonstrate these system-level characteristics and provide software for channel configuration and data capture.
High-Speed AFE Development
High-speed analog front-ends serve applications including ultrasound imaging, radar receivers, and communications systems. These platforms combine wideband amplifiers, variable gain stages, and high-speed ADCs with the signal routing and shielding needed for high-frequency operation.
Evaluation platforms for high-speed AFEs often target specific applications with corresponding signal characteristics. Medical ultrasound AFEs include time-gain compensation and beamforming support. Communications receiver AFEs integrate automatic gain control and frequency translation stages.
Development with high-speed AFEs requires understanding the gain-bandwidth product limitations, noise figure contributions from each stage, and proper impedance matching throughout the signal chain. Evaluation platforms characterize these parameters and provide reference designs for specific applications.
Sensor Interface AFE Platforms
Sensor-specific AFE development platforms address the unique requirements of particular sensor types. Capacitive sensing AFEs for touch interfaces and proximity detection require specialized excitation and detection circuits. Resistive sensor AFEs for temperature and strain measurement need precision current sources and ratiometric measurement techniques.
These specialized platforms demonstrate application-specific circuit techniques that would be difficult to develop from first principles. Integration with sensor manufacturers' evaluation kits enables complete sensor-to-digital development environments.
Precision Reference Evaluation
Voltage reference quality fundamentally limits data converter accuracy. Precision reference evaluation platforms enable characterization of reference performance and development of reference circuits for production applications.
Understanding Reference Specifications
Voltage reference specifications include initial accuracy, temperature coefficient, long-term stability, noise, and load regulation. Initial accuracy can often be trimmed or calibrated, but temperature coefficient and noise represent fundamental limitations that must be addressed through component selection.
Reference evaluation platforms provide controlled thermal environments for temperature coefficient measurement, low-noise instrumentation for noise characterization, and long-term monitoring capabilities for stability assessment. Understanding these characteristics guides reference selection for specific converter applications.
Reference Development Platforms
Major analog semiconductor vendors provide reference evaluation boards demonstrating their highest-performance devices. Analog Devices' ADR4550 evaluation kit, Linear Technology's (now part of Analog Devices) LTZ1000 reference designs, and Texas Instruments' REF50xx evaluation modules exemplify platforms for precision reference development.
These platforms typically include proper thermal design, low-noise power conditioning, and measurement access points for characterization. Reference designs and layout files enable replication of demonstrated performance in production circuits.
Reference Circuit Development
Beyond evaluating reference ICs, development platforms support complete reference circuit development including buffers, voltage dividers, and distribution networks. Reference loading effects, buffer noise contributions, and thermal considerations all impact system performance.
Evaluation platforms often provide multiple output configurations to assess different buffer topologies and loading scenarios. Understanding these trade-offs guides development of reference circuits appropriate for specific converter requirements.
Signal Chain Development Boards
Signal chain development platforms integrate multiple stages from input conditioning through digital output, demonstrating complete analog-to-digital or digital-to-analog paths. These comprehensive platforms enable system-level optimization that component-level evaluation boards cannot address.
Complete Acquisition System Platforms
Data acquisition (DAQ) development platforms combine input protection, multiplexing, signal conditioning, and analog-to-digital conversion into integrated evaluation systems. These platforms demonstrate the proper integration of stages that might be evaluated separately on individual component boards.
National Instruments, which pioneered data acquisition systems, provides extensive development platforms ranging from USB-based single-channel devices to PXI-based multi-channel systems. While these are products rather than evaluation boards, they serve as reference implementations demonstrating achievable performance levels.
Semiconductor vendors offer signal chain reference designs that combine their amplifiers, references, and converters into optimized subsystems. These designs often target specific applications such as industrial sensors, medical instruments, or communications systems, providing starting points for custom development.
Digital-to-Analog Signal Chains
DAC signal chain development addresses the complete path from digital data through analog signal generation. Platforms combine DACs with reconstruction filters, output amplifiers, and often RF upconversion stages for communications applications.
Complete transmitter evaluation platforms from communications semiconductor vendors demonstrate integration of digital signal processing, DAC conversion, and RF signal generation. While complex, these platforms provide reference implementations for demanding applications.
Mixed-Signal System Development
Many applications require both ADC and DAC functions with coordinated timing and shared references. Mixed-signal development platforms address these integrated requirements, demonstrating proper synchronization, reference sharing, and isolation between conversion paths.
Software-defined radio (SDR) platforms exemplify mixed-signal development environments, combining high-speed ADCs and DACs with FPGA signal processing in integrated systems. Platforms from Analog Devices, Xilinx, and Intel (formerly Altera) provide complete RF-to-digital development environments.
Dynamic Performance Testing
Data converter dynamic performance characterization requires specialized test equipment and techniques beyond typical benchtop measurements. Development platforms often include or interface with dynamic test systems that capture FFT-based specifications including SNR, THD, and SFDR.
FFT-Based Converter Testing
Fast Fourier Transform analysis enables extraction of dynamic performance specifications from sampled data. Coherent sampling techniques ensure accurate spectral analysis without windowing artifacts. Test signal purity requirements often exceed the specifications of general-purpose signal generators.
Evaluation platforms from converter manufacturers typically include software for FFT-based testing, performing coherent sample capture and spectral analysis. Understanding the relationship between test conditions and measured specifications enables proper interpretation of datasheet parameters.
Signal Source Requirements
Testing high-performance ADCs requires signal sources with lower distortion and noise than the converter under test. Ultra-low-distortion oscillators, often based on Wien bridge or crystal oscillator designs, serve as reference sources for ADC testing.
Audio Precision and Stanford Research Systems provide specialized low-distortion sources for converter testing. For high-frequency applications, filtered outputs from high-quality RF signal generators serve similar purposes. Understanding source limitations prevents erroneous attribution of source artifacts to converter performance.
Clock Source Requirements
Clock jitter directly impacts converter dynamic performance, particularly at high input frequencies where aperture jitter becomes the dominant noise source. Testing high-performance converters requires clock sources with phase noise specifications appropriate for the converter's jitter sensitivity.
Ultra-low-phase-noise oscillators from manufacturers including Wenzel Associates and Crystek provide reference clock sources for converter testing. Evaluation platforms often include characterized clock sources or provide specifications for external clock requirements.
DAC Output Analysis
DAC dynamic performance testing requires capture and analysis of analog outputs. High-speed digitizers or spectrum analyzers characterize DAC spectral purity. The test instrument must have specifications exceeding the DAC under test to avoid measurement limitations.
Integrated evaluation platforms often include loopback configurations where DAC outputs connect to matched ADC inputs for system-level characterization. While this approach cannot independently characterize each converter, it efficiently evaluates complete signal chain performance.
Linearity Measurement Systems
Data converter linearity specifications including INL (integral nonlinearity) and DNL (differential nonlinearity) require specialized test methods distinct from dynamic testing. Linearity testing evaluates static transfer function accuracy rather than frequency-domain behavior.
ADC Linearity Testing
ADC linearity testing traditionally uses precision ramp or servo-loop methods to exercise all codes and measure deviation from ideal transfer characteristics. The test source must have lower nonlinearity than the converter under test, presenting challenges for high-resolution converters.
Histogram testing provides an alternative approach using known statistical distributions (typically linear ramp or sinusoidal) to infer code width variations from hit counts. This approach relaxes source linearity requirements at the cost of requiring large sample counts for statistical significance.
Evaluation platforms typically include software for histogram-based linearity testing, which is more accessible than precision DC testing for most development purposes. Understanding the limitations and assumptions of histogram methods prevents misinterpretation of results.
DAC Linearity Characterization
DAC linearity testing requires precision voltage measurement of outputs at all code values. High-resolution digital multimeters or specialized differential voltage measuring systems capture the transfer function for INL and DNL calculation.
For high-speed DACs, settling to final value before measurement adds complexity. Dynamic linearity testing methods excite the DAC with specific patterns and analyze output spectra for linearity-related artifacts.
Automated Linearity Test Systems
Production linearity testing typically uses automated test equipment (ATE) with precision sources and measurement systems. Development platforms may interface with ATE for production correlation testing, ensuring that development characterization predicts production test results.
Understanding the relationship between development and production testing informs specification decisions and test method selection during the design phase.
Mixed-Signal Prototyping Platforms
Beyond component evaluation, comprehensive mixed-signal prototyping platforms support development of complete converter-based systems. These platforms combine configurable analog sections with digital processing and system integration capabilities.
FPGA-Based Mixed-Signal Development
FPGA development platforms with integrated analog converters provide flexible environments for mixed-signal system development. Xilinx Zynq UltraScale+ RFSoC devices integrate high-speed ADCs and DACs directly into the FPGA package, eliminating the interface complexity of discrete converter integration.
Development kits for these integrated devices provide complete software-defined radio platforms, data acquisition systems, or arbitrary waveform generators depending on configuration. The programmable logic enables implementation of digital filtering, signal processing, and system control alongside the analog conversion functions.
Modular Instrumentation Platforms
Modular instrumentation standards including PXI, PXIe, and LXI provide frameworks for configurable measurement system development. Data converter modules following these standards enable rapid assembly of custom acquisition and generation systems.
National Instruments, Keysight, and specialty instrumentation vendors provide converter modules spanning a wide range of specifications. While more expensive than evaluation boards, these platforms provide production-quality implementations suitable for developing and validating test procedures.
Arduino and Maker Platform Extensions
Educational and prototyping applications benefit from data converter add-ons for popular development platforms. ADC and DAC shields for Arduino, Raspberry Pi, and similar platforms provide accessible entry points for converter-based project development.
While specifications of these platforms typically fall below professional requirements, they serve valuable roles in education, proof-of-concept development, and applications where ultimate performance is not critical. Understanding their limitations prevents inappropriate use in demanding applications.
Software and Analysis Tools
Data converter development relies heavily on software tools for device configuration, data capture, and performance analysis. Understanding available tools and their capabilities accelerates development and enables comprehensive characterization.
Vendor-Provided Evaluation Software
Major analog semiconductor vendors provide evaluation software tailored to their converter portfolios. Analog Devices' ACE (Analysis, Control, Evaluation) platform, Texas Instruments' Precision Labs software, and Microchip's tools provide device configuration, data capture, and basic analysis capabilities.
These tools typically run on Windows platforms and communicate with evaluation boards through USB or other standard interfaces. While vendor-specific, they provide the fastest path to initial device evaluation and characterization.
Independent Analysis Tools
MATLAB and Python with appropriate libraries provide powerful environments for converter data analysis independent of vendor tools. FFT analysis, histogram processing, and statistical characterization can be implemented with complete control over analysis parameters.
Open-source tools for converter testing, while less polished than commercial alternatives, provide transparency and customization capabilities valuable for research and specialized applications.
Integration with Test Automation
Development eventually transitions to production, requiring integration with automated test systems. Understanding how development characterization maps to production test parameters informs specification decisions and prevents surprises during manufacturing ramp.
Evaluation platforms that support scripted control and data export facilitate integration with broader test automation environments, enabling efficient correlation between development and production testing.
Selecting Development Platforms
Choosing appropriate data converter development platforms involves matching platform capabilities to project requirements across multiple dimensions including converter architecture, performance level, and development stage.
Matching Architecture to Application
Converter architecture fundamentally shapes application suitability. SAR ADCs suit multiplexed sensor systems requiring moderate speed and resolution. Delta-sigma ADCs address precision measurement where bandwidth is secondary to resolution. Pipeline ADCs serve high-speed communications and instrumentation applications.
Selecting evaluation platforms that match the intended architecture provides relevant experience and reference designs. While exploring alternative architectures may reveal unexpected solutions, initial development typically benefits from platforms aligned with expected implementation.
Performance Level Considerations
Development platforms should meet or exceed target performance requirements. Evaluating a 16-bit converter on a platform with 12-bit reference quality cannot reveal the converter's true capabilities. Platform specifications including reference noise, power supply rejection, and layout quality establish floors below which converter performance cannot be assessed.
For the highest performance requirements, multiple evaluation approaches may be necessary. Initial evaluation on standard platforms identifies suitable converter candidates, while custom high-performance test fixtures characterize ultimate achievable specifications.
Development Stage Alignment
Different development stages benefit from different platform characteristics. Early exploration prioritizes flexibility and ease of configuration. Detailed characterization requires comprehensive measurement capabilities. Production preparation emphasizes correlation with manufacturing test conditions.
A development program may employ multiple platforms across these stages, from flexible prototyping boards through precision characterization systems to production-representative test fixtures.
Best Practices for Development
Effective data converter development follows established practices that accelerate progress and prevent common pitfalls. Learning from evaluation platform implementations provides a foundation for successful custom designs.
Study Reference Designs Carefully
Evaluation boards represent significant engineering investment in achieving datasheet performance. Layout files, schematics, and application notes document the techniques used. Before developing custom circuits, understand why the reference design makes specific choices.
Deviating from reference design practices should be intentional rather than accidental. When custom requirements demand different approaches, understand the trade-offs and verify that modified implementations achieve required performance.
Characterize Before Customizing
Baseline characterization on evaluation platforms establishes achievable performance levels before custom development introduces additional variables. When custom implementations underperform expectations, comparison with evaluation board results isolates whether issues originate in circuit implementation or converter limitations.
Document Measurement Conditions
Converter specifications depend on measurement conditions including input frequency, sampling rate, temperature, and load. Ensure that characterization conditions match the intended application to avoid surprises when specifications obtained under optimal test conditions fail to predict real-world behavior.
Plan for Production Testing
Development characterization informs production test requirements, but production testing operates under different constraints including speed, cost, and equipment availability. Understanding production test capabilities during development prevents specifications that cannot be practically verified.
Emerging Trends
Data converter development platforms continue to evolve in response to changing technology capabilities and application requirements. Understanding current trends helps anticipate future development needs.
Increasing Integration
System-in-package and system-on-chip implementations combine converters with signal processing, reducing the analog interface complexity that development platforms traditionally address. FPGA-integrated converters and smart sensor modules shift development focus from analog circuit design toward digital configuration and algorithm development.
Higher Performance Boundaries
Converter performance continues advancing, with ADCs exceeding 20 bits of effective resolution and DACs operating at tens of gigasamples per second. Development platforms must keep pace with these advances, requiring ever-more-sophisticated analog design and measurement capabilities.
Simulation and Virtual Prototyping
Behavioral models and simulation tools enable initial system exploration before hardware development. While not replacing physical prototyping, simulation accelerates early design phases and enables exploration of architectures not represented in available evaluation hardware.
Conclusion
Data converter development platforms provide essential infrastructure for bridging analog and digital domains in electronic system design. From simple evaluation boards for component selection through comprehensive mixed-signal prototyping systems, these platforms encode engineering expertise in accessible forms that accelerate development and improve outcomes.
Understanding the range of available platforms, from ADC and DAC evaluation boards through analog front-end systems, precision references, and dynamic test equipment, enables informed selection of appropriate tools for specific project requirements. The reference designs, layout files, and application notes accompanying these platforms provide templates for production implementations that achieve characterized performance levels.
As electronic systems demand ever-higher conversion performance for applications ranging from precision industrial sensors to high-speed communications, data converter development platforms continue evolving to address new challenges. Engineers who understand these platforms and apply them effectively achieve better results more efficiently than those attempting to develop converter applications from first principles.
Whether evaluating a new converter for a simple sensor interface or developing a sophisticated multi-channel data acquisition system, appropriate development platform selection and application establishes the foundation for successful data converter integration in any electronic system design.